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Design of a suitable length standard for nanp-CT measuring device
Kožiol, Martin ; Jankových, Róbert (referee) ; Šrámek, Jan (advisor)
The diploma thesis deals with the design of three length standards, which will serve to ensure metrological traceability between Rigaku nano3DX, SIOS NMM-1, Zeiss UPMC Carat 850 and other devices located at ÚVSSR BUT and CEITEC Brno. The first part of the thesis focuses on the theoretical acquaintance with concepts closely related to the issue of ensuring metrological traceability. In addition, this section deals with computed tomography and the description of individual devices. The second part of the thesis is devoted to design, production process and testing of individual standards. The last part describes the ensuring the calibration of the smallest standard, the so-called Nano standard and the calculation of the uncertainty of measuring its calibrated length. At the end of the thesis, the outputs of these activities are evaluated.
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Determination of measurement uncertainty of a coordinate measuring machine in nanometrology
Potanko, Andrej ; Jankových, Róbert (referee) ; Šrámek, Jan (advisor)
The diploma thesis deals with the determination of measurement uncertainty on coordinate measuring machines in the field of nanometrology. These are SIOS NMM 1 and Zeiss UPMC 850 Carat machines, which are used at the CMI workplace in Brno. In the theoretical part, the work is devoted to basic terminology in the field of measurement and general characteristics of coordinate measuring machines. The theoretical part concludes with a description of the devices used for measurement. In the practical part, experimental measurements are performed on both devices with subsequent identification and quantification of individual components of uncertainties affecting the measurement. The last part of the thesis is devoted to the overall evaluation of measurements on Zeiss and SIOS devices and their metrological comparison.
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Design of a suitable length standard for nanometology at the CMI Brno and CEITEC Brno
Češek, Jakub ; Jankových, Róbert (referee) ; Šrámek, Jan (advisor)
The thesis deals with the design of a suitable length standard for nanometrology. This length standard will be used for metrological traceability of the Rigaku nano3DX located at CEITEC Brno and the SIOS NMM-1 device which is located at ČMI Brno. The first part is focused on the description of these measuring instruments, the analysis of their metrological traceability requirements and the requirements for the material length standard. The second part is devoted to the concrete possibilities of the etalon design, 3D printing of the prototype of the standard and verification of its dimensional compatibility. At the end of the thesis, the evaluation and selection of the appropriate standard design is made.
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Determination of measurement uncertainty of a coordinate measuring machine in nanometrology
Potanko, Andrej ; Jankových, Róbert (referee) ; Šrámek, Jan (advisor)
The diploma thesis deals with the determination of measurement uncertainty on coordinate measuring machines in the field of nanometrology. These are SIOS NMM 1 and Zeiss UPMC 850 Carat machines, which are used at the CMI workplace in Brno. In the theoretical part, the work is devoted to basic terminology in the field of measurement and general characteristics of coordinate measuring machines. The theoretical part concludes with a description of the devices used for measurement. In the practical part, experimental measurements are performed on both devices with subsequent identification and quantification of individual components of uncertainties affecting the measurement. The last part of the thesis is devoted to the overall evaluation of measurements on Zeiss and SIOS devices and their metrological comparison.
|
|
|
Design of a suitable length standard for nanp-CT measuring device
Kožiol, Martin ; Jankových, Róbert (referee) ; Šrámek, Jan (advisor)
The diploma thesis deals with the design of three length standards, which will serve to ensure metrological traceability between Rigaku nano3DX, SIOS NMM-1, Zeiss UPMC Carat 850 and other devices located at ÚVSSR BUT and CEITEC Brno. The first part of the thesis focuses on the theoretical acquaintance with concepts closely related to the issue of ensuring metrological traceability. In addition, this section deals with computed tomography and the description of individual devices. The second part of the thesis is devoted to design, production process and testing of individual standards. The last part describes the ensuring the calibration of the smallest standard, the so-called Nano standard and the calculation of the uncertainty of measuring its calibrated length. At the end of the thesis, the outputs of these activities are evaluated.
|
|
|
Design of a suitable length standard for nanometology at the CMI Brno and CEITEC Brno
Češek, Jakub ; Jankových, Róbert (referee) ; Šrámek, Jan (advisor)
The thesis deals with the design of a suitable length standard for nanometrology. This length standard will be used for metrological traceability of the Rigaku nano3DX located at CEITEC Brno and the SIOS NMM-1 device which is located at ČMI Brno. The first part is focused on the description of these measuring instruments, the analysis of their metrological traceability requirements and the requirements for the material length standard. The second part is devoted to the concrete possibilities of the etalon design, 3D printing of the prototype of the standard and verification of its dimensional compatibility. At the end of the thesis, the evaluation and selection of the appropriate standard design is made.
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